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CanvasM establishes its first 3G Device Test Lab in India
TT Correspondent |  Mumbai |  27 Dec 2010

CanvasM, Tech Mahindra’s VAS subsidiary, today entered into an agreement with Qualcomm Incorporated pursuant to which CanvasM will operate a 3G device testing lab based in Noida, India. The lab will provide quality testing to 3G handsets and devices for their compliance with regulatory, technical and international performance standards. This initiative is the first investment undertaken by Tech Mahindra towards adopting 3G technology and driving the technology in India according to international standards.

The lab will enable CanvasM to offer device testing services in diverse areas of testing like Application Testing, Radio/Protocol Testing, Field Testing, Inter-operability Testing and Performance Testing with advanced proficiency in 3G. CanvasM will now be following test processes developed by Qualcomm which are accepted as industry benchmark for 3G device testing.

Jagdish Mitra, CEO, CanvasM said, “CanvasM is pleased to launch this 3G Device Test Lab, under contract to Qualcomm, the global leader in 3G and next generation technologies.  As 3G becomes the next growth driver for the Indian telecom market, quality of service will be critical. We at CanvasM have made significant investments in this lab towards value added services and device testing to help ensure a great 3G experience for Indian consumers”

Dr. Sandeep Sibal, country manager and vice president of Business Development for Qualcomm India and South Asia, said, “We are pleased to collaborate with CanvasM to launch this 3G Device Testing lab in India for the benefit of our OEM and operator customers.  Testing of 3G devices is important as device quality impacts 3G connectivity, 3G data and voice services, as well as the overall consumer experience of 3G subscribers. Further, since 3G operators in India have only 5MHz of spectrum in the 2.1 GHz band, 3G device testing is beneficial in ensuring optimal utilization of their network capacity.”

    
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27 Dec 2010(IST)  
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